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raman spectroscopy diode laser  (Renishaw Inc)

 
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    Renishaw Inc raman spectroscopy diode laser
    Raman Spectroscopy Diode Laser, supplied by Renishaw Inc, used in various techniques. Bioz Stars score: 90/100, based on 1 PubMed citations. ZERO BIAS - scores, article reviews, protocol conditions and more
    https://www.bioz.com/product/raman+spectroscopy+diode+laser/raman+spectroscopy+diode+laser/pm40118364-49-22-24
    Average 90 stars, based on 1 article reviews
    raman spectroscopy diode laser - by Bioz Stars, 2026-10
    90/100 stars

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    other:

    Article Title: Settling velocities of microplastics with different shapes in sediment-water mixtures.
    Article Snippet: The polymers were selected from the most commonly found classes in aquatic environment (Erni-Cassola et al., 2019; Andrady, 2011) and classified using Raman spectroscopy (Renishaw, 2000 microRaman spectrometer equipped with a 785 nm diode laser, Fig. S2).



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    Fig. 1. Microstructures of the composite sintered at 900 ◦C, 50 MPa, and 1 h by adding 0.025 g of lanthanum acetate to 5 g of copper powders (a) (b) SEM image, (b) is the local image of the red rectangle area in (a); (c) SEM image after being etched by the FeCl3 and HCl mixed solution; (d) the <t>Raman</t> spectrum; (e) the grain-size distribution obtained by EBSD, the inner figure is the Inverse Pole Figure (IPF) map; (d) the XRD pattern; (g) the bright-field TEM image; (h) HRTEM image of the blue rectangular area in (g); (i) the Fast Fourier Transform (FFT) pattern corresponds to the yellow circle in (h); (j) the FFT pattern corresponds to the red rectangular area in (h). (A colour version of this figure can be viewed online.)
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    Fig. 1. Microstructures of the composite sintered at 900 ◦C, 50 MPa, and 1 h by adding 0.025 g of lanthanum acetate to 5 g of copper powders (a) (b) SEM image, (b) is the local image of the red rectangle area in (a); (c) SEM image after being etched by the FeCl3 and HCl mixed solution; (d) the <t>Raman</t> spectrum; (e) the grain-size distribution obtained by EBSD, the inner figure is the Inverse Pole Figure (IPF) map; (d) the XRD pattern; (g) the bright-field TEM image; (h) HRTEM image of the blue rectangular area in (g); (i) the Fast Fourier Transform (FFT) pattern corresponds to the yellow circle in (h); (j) the FFT pattern corresponds to the red rectangular area in (h). (A colour version of this figure can be viewed online.)
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    Fig. 1. Microstructures of the composite sintered at 900 ◦C, 50 MPa, and 1 h by adding 0.025 g of lanthanum acetate to 5 g of copper powders (a) (b) SEM image, (b) is the local image of the red rectangle area in (a); (c) SEM image after being etched by the FeCl3 and HCl mixed solution; (d) the <t>Raman</t> spectrum; (e) the grain-size distribution obtained by EBSD, the inner figure is the Inverse Pole Figure (IPF) map; (d) the XRD pattern; (g) the bright-field TEM image; (h) HRTEM image of the blue rectangular area in (g); (i) the Fast Fourier Transform (FFT) pattern corresponds to the yellow circle in (h); (j) the FFT pattern corresponds to the red rectangular area in (h). (A colour version of this figure can be viewed online.)
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    Fig. 1. Microstructures of the composite sintered at 900 ◦C, 50 MPa, and 1 h by adding 0.025 g of lanthanum acetate to 5 g of copper powders (a) (b) SEM image, (b) is the local image of the red rectangle area in (a); (c) SEM image after being etched by the FeCl3 and HCl mixed solution; (d) the Raman spectrum; (e) the grain-size distribution obtained by EBSD, the inner figure is the Inverse Pole Figure (IPF) map; (d) the XRD pattern; (g) the bright-field TEM image; (h) HRTEM image of the blue rectangular area in (g); (i) the Fast Fourier Transform (FFT) pattern corresponds to the yellow circle in (h); (j) the FFT pattern corresponds to the red rectangular area in (h). (A colour version of this figure can be viewed online.)

    Journal: Carbon

    Article Title: Superior electrical conductivity-strength combination of an in-situ fabricated La2O3-doped copper/graphene composite conductor

    doi: 10.1016/j.carbon.2022.06.086

    Figure Lengend Snippet: Fig. 1. Microstructures of the composite sintered at 900 ◦C, 50 MPa, and 1 h by adding 0.025 g of lanthanum acetate to 5 g of copper powders (a) (b) SEM image, (b) is the local image of the red rectangle area in (a); (c) SEM image after being etched by the FeCl3 and HCl mixed solution; (d) the Raman spectrum; (e) the grain-size distribution obtained by EBSD, the inner figure is the Inverse Pole Figure (IPF) map; (d) the XRD pattern; (g) the bright-field TEM image; (h) HRTEM image of the blue rectangular area in (g); (i) the Fast Fourier Transform (FFT) pattern corresponds to the yellow circle in (h); (j) the FFT pattern corresponds to the red rectangular area in (h). (A colour version of this figure can be viewed online.)

    Article Snippet: The structural defects of Gr were analyzed by the 532-nm green-diode laser Raman spectroscopy (Renishaw in Via).

    Techniques:

    Fig. 5. Microstructures of the Cu/Gr composites doped with 0.5 wt% lanthanum acetate sintered at (a) 700 ◦C, (b) 800 ◦C, (c) 900 ◦C, and (d) 1,000 ◦C, respectively; The insets are the corresponding Raman spectra. (A colour version of this figure can be viewed online.)

    Journal: Carbon

    Article Title: Superior electrical conductivity-strength combination of an in-situ fabricated La2O3-doped copper/graphene composite conductor

    doi: 10.1016/j.carbon.2022.06.086

    Figure Lengend Snippet: Fig. 5. Microstructures of the Cu/Gr composites doped with 0.5 wt% lanthanum acetate sintered at (a) 700 ◦C, (b) 800 ◦C, (c) 900 ◦C, and (d) 1,000 ◦C, respectively; The insets are the corresponding Raman spectra. (A colour version of this figure can be viewed online.)

    Article Snippet: The structural defects of Gr were analyzed by the 532-nm green-diode laser Raman spectroscopy (Renishaw in Via).

    Techniques: